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A detailed close-up of an integrated circuit (IC) die, showing the intricate layout of its components and connections.

IDE3381 APOCAT

PRODUCT

Integrated Circuits

CATEGORY

ROICs for Radiation Detectors

About

Summary

IDE3381 APOCAT – the Array of Photon Counters Above Threshold is an integrated circuit (ASIC) for reading out up to 16 photomultiplier tubes (PMTs) and silicon photomultipliers (SiPMs). With scintillators, it is ideal for high-resolution x-ray and gamma-ray pulse-height spectroscopy, or photon timing and 4-bin energy resolved photon counting at high data rates up to 1Mcps per channel, synchronously or asynchronously per channel. The ASIC was originally designed for space missions, but thanks to on-chip ADC and versatile registers, it can be programmed for other use cases including low-power terrestrial applications with PMTs and SiPMs.”


General Description

Product Features


Detectors

SiPM, PMT

Application

x-ray and gamma-ray spectroscopy, timing, counting, and imaging

Number of inputs

16 INA, or 17 INB

Input charge range

Depends on programmable settings: Max. charge at INA: -40pC, -100pC, -200pC, -400pC, -800pC depending on setting. Max. charge at INB: +/-40pC In addition, 6 fine gain tunings, individual for each channel [mV/pC]: 46, 48, 51, 53, 55, 265

Shaping time

Globally programmable: 50ns, 150ns, 300ns, 2000ns

Nominal capacitive load

<= several nF at INA <= 100pF at INB

Equivalent Noise Charge (ENC)

Depending on shaping time: 7fC at 50ns, 15fC at 150ns, 31fC at 300ns

Trigger threshold

10-bit programmable, individually for each channel

Trigger outputs

One global OR from all channels; in addition, each channel has individual trigger output (DOUT)

Outputs

Each channel has one analog output (AOUT)

Test and calibration

Injection of calibrated charge, or generation of internally calibrated and programable charge

Power consumption

360mW using INA and on-chip ADC; flexible and programmable power-down options

Max. event detection rate

1Mcps/channel asynchronous or synchronous

ADC Resolution

12-bit

Data interface

SPI for programming and counter readout; ADC serial digital output

Radiation hardness

Based on tests with other ASICs designed in the same technology. TID: up to 340 krad(Si) without relevant change; SEL: up to 137 MeV cm2 / mg without latch-up; SEU/SET: LET threshold 18 MeV cm2 / mg or larger

Input voltage range

+3.3V


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